data sheet doc. no : qw0905-LUY21233 rev : a date : 11 - feb. - 2006 super bright tower type led lamps LUY21233 ligitek electronics co.,ltd. property of ligitek only
note : 1.all dimension are in millimeter tolerance is 0.25mm unless otherwise noted. 2.specifications are subject to change without notice. directivity radiation part no. LUY21233 package dimensions ligitek electronics co.,ltd. property of ligitek only page 1/4 + - -60 -30 0 30 60 25% 50% 75% 100%100% 75% 50% 25% 0 4.5 3.5 3.0 7.5 1.0min 25.0min 2.54 typ 0.5 typ 1.5 max 3.7 3.0
t opr operating temperature -40 ~ +85 note : 1.the forward voltage data did not including 0.1v testing tolerance. 2. the luminous intensity data did not including 15% testing tolerance. typical electrical & optical characteristics (ta=25 ) yellow soldering temperature material part no LUY21233 algainp storage temperature spectral halfwidth nm forward voltage @20ma(v) viewing angle 2 1/2 (deg) luminous intensity @20ma(mcd) dominant wave length dnm water clear emitted lens 59515 2.6 max. 1.7 min. 160 min. 20 300 typ. max 260 for 5 sec max (2mm from body) -40 ~ +100 color tsol tstg absolute maximum ratings at ta=25 electrostatic discharge( * ) forward current reverse current @5v peak forward current duty 1/10@10khz power dissipation parameter page 2/4 2000 ratings i f esd ir pd i fp symbol ma 50 10 120 90 a v ma mw uy unit ligitek electronics co.,ltd. property of ligitek only part no. LUY21233 static electricity or power surge will damage the led. use of a conductive wrist band or anti-electrosatic glove is recommended when handing these led. all devices, equipment and machinery must be properly grounded. *
ambient temperature( ) fig.4 relative intensity vs. temperature r e l a t i v e i n t e n s i t y @ 2 0 m a wavelength (nm) 500 0 0.5 550600650 ambient temperature( ) fig.5 relative intensity vs. wavelength fig.3 forward voltage vs. temperature f o r w a r d v o l t a g e @ 2 0 m a n o r m a l i z @ 2 5 -20 1.0 -40 0.8 20 060 40 1.0 0.9 1.1 1.2 0.5 r e l a t i v e i n t e n s i t y @ 2 0 m a n o r m a l i z e @ 2 5 100 80-40-20 0 020 3.0 2.5 2.0 1.5 1.0 80 60 40100 ligitek electronics co.,ltd. property of ligitek only fig.2 relative intensity vs. forward current forward current(ma) 4.0 fig.1 forward current vs. forward voltage typical electro-optical characteristics curve 100 f o r w a r d c u r r e n t ( m a ) 0.1 1.0 10 1.0 forward voltage(v) 2.03.0 1000 uy chip r e l a t i v e i n t e n s i t y n o r m a l i z e @ 2 0 m a 2.0 1.5 1.0 0.5 5.0 0 1.010 3.0 2.5 page3/4 1001000 part no. LUY21233
the purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. 1.ta=105 5 &-40 5 (10min) (10min) 2.total 10 cycles mil-std-202: 107d mil-std-750: 1051 mil-std-883: 1011 mil-std-202: 208d mil-std-750: 2026 mil-std-883: 2003 jis c 7021: a-2 mil-std-202: 210a mil-std-750: 2031 jis c 7021: a-1 1.t.sol=230 5 2.dwell time=5 1sec 1.t.sol=260 5 2.dwell time= 10 1sec. solderability test thermal shock test solder resistance test this test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. this test intended to see soldering well performed or not. page 4/4 mil-std-202:103b jis c 7021: b-11 mil-std-750: 1026 mil-std-883: 1005 jis c 7021: b-1 jis c 7021: b-12 mil-std-883:1008 jis c 7021: b-10 reference standard ligitek electronics co.,ltd. property of ligitek only reliability test: the purpose of this is the resistance of the device which is laid under condition of high temperature for hours. 1.ta=105 5 2.t=1000 hrs (-24hrs, +72hrs) high temperature storage test 1.ta=65 5 2.rh=90%~95% 3.t=240hrs 2hrs 1.ta=-40 5 2.t=1000 hrs (-24hrs, +72hrs) high temperature high humidity test low temperature storage test the purpose of this test is the resistance of the device under tropical for hours. the purpose of this is the resistance of the device which is laid under condition of low temperature for hours. 1.under room temperature 2.if=20ma 3.t=1000 hrs (-24hrs, +72hrs) test condition operating life test test item this test is conducted for the purpose of detemining the resistance of a part in electrical and themal stressed. description part no. LUY21233
|
